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The Scanning Electron/Ion/Probe Microscopy in Materials Characterization certification course requires interested candidates to hold an M.Sc. or BE degree.
Moreover, the Scanning Electron/Ion/Probe Microscopy in Materials Characterization certification is only available for candidates who secure an adequate final score, which will be the sum of his/her examination score and average assignment marking.
Swayam will consider 75% of the test’s score (out of 100) and 25% of the assignment marks (best six out of the total eight). To achieve certification, aspirants should acquire >=10/25 for their in-course assessments and >=30/75 for their proctored exam. Failing to maintain this, candidates cannot receive certificates even after getting >=40/100 or more.
Swayam will conduct the Scanning Electron/Ion/Probe Microscopy in Materials Characterization prog...Read More
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Scanning Electron/Ion/Probe Microscopy in Materials Characterization fee structure -
Program type
Fees payable
Scanning Electron/Ion/Probe Microscopy in Materials Characterization
NA
Certification exam registration
Rs. 1,000
Swayam will conduct the Scanning Electron/Ion/Probe Microscopy in Materials Characterization programme test on the date provided, at their designated test centres throughout the country. Students can register for this once the online form is available, wherein they can also check the numerous examination details and available centres.
Candidates can select from two sessions, a morning one (9 am to 12 pm) and an afternoon one (2 pm to 5 pm), where they must undertake the test in-person.
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